RETRACTED ARTICLE: Nanocharacterization of Titanium Nitride Thin Films Obtained by Reactive Magnetron Sputtering

JOM, May 2015

Violeta Valentina Merie, Marius Sorin Pustan, Corina Bîrleanu, Gavril Negrea

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RETRACTED ARTICLE: Nanocharacterization of Titanium Nitride Thin Films Obtained by Reactive Magnetron Sputtering

JOM RETRACTED ARTICLE: Nanocharacterization of Titanium Nitride Thin Films Obtained by Reactive Magnetron Sputtering VIOLETA VALENTINA MERIE 0 MARIUS SORIN PUSTAN 0 CORINA BIˆRLEANU 0 GAVRIL NEGREA 0 0 1.-Department of Mechanical Systems Engineering, Faculty of Machine Building, Technical University of Cluj-Napoca , 103-105 Muncii Avenue, Cluj-Napoca , Romania. 2.-Department of Materials Science and Engineering, Faculty of Materials and Environmental Engineering, Technical University of Cluj-Napoca , 103-105 Muncii Avenue, Cluj-Napoca, Romania. 3.- - This article has been retracted by the editor due to significant overlap with a prior publication by the same authors in the proceedings of the 2nd International Conference on Structural Nano Composites under the copyright of the Institute of Physics. JOM policy does not allow for submission for publication of previously published work. The online version of this article contains the full text of the retracted article as electronic supplementary material. ELECTRONIC SUPPLEMENTARY MATERIAL The online version of this article (doi:10.1007/ s11837-015-1460-2) contains supplementary material, which is available to authorized users.


This is a preview of a remote PDF: https://link.springer.com/content/pdf/10.1007%2Fs11837-015-1460-2.pdf

Violeta Valentina Merie, Marius Sorin Pustan, Corina Bîrleanu, Gavril Negrea. RETRACTED ARTICLE: Nanocharacterization of Titanium Nitride Thin Films Obtained by Reactive Magnetron Sputtering, JOM, 2017, 1455-1455, DOI: 10.1007/s11837-015-1460-2