Erratum to: Determination of cut-off time of accelerated aging test under temperature stress for LED lamps

Frontiers of Information Technology & Electronic Engineering, Oct 2017

In the original version of this article, the second affiliation should be removed, and the correct affiliations are as given above. In the original version of this article, the ORCID for Jian HAO is incorrect. The correct one should be http://orcid.org/0000-0002-2419-2508.

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Erratum to: Determination of cut-off time of accelerated aging test under temperature stress for LED lamps

Front Inform Technol Electron Eng 2095-9184 Erratum: Erratum to: Determination of cut-off time of accelerated aging test under temperature stress for LED lamps Jian HAO 0 1 Lei JING 0 Hong-liang KE 0 1 Yao WANG 0 1 Qun GAO 0 Xiao-xun WANG 0 1 Qiang SUN 0 Zhi-jun XU 0 0 Opto-Electronics Technology Center, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences , Changchun 130033 , China) 1 University of Chinese Academy of Sciences , Beijing 100049, China) ( - In the original version of this article, the second affiliation should be removed, and the correct affiliations are as given above. In the original version of this article, the ORCID for Jian HAO is incorrect. The correct one should be http://orcid.org/0000-0002-2419-2508.


This is a preview of a remote PDF: https://link.springer.com/content/pdf/10.1631%2FFITEE.15e0483.pdf

Jian Hao, Lei Jing, Hong-liang Ke, Yao Wang, Qun Gao, Xiao-xun Wang, Qiang Sun, Zhi-jun Xu. Erratum to: Determination of cut-off time of accelerated aging test under temperature stress for LED lamps, Frontiers of Information Technology & Electronic Engineering, 2017, 1677-1677, DOI: 10.1631/FITEE.15e0483