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Search: authors:"Geoff Birch"

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Fast test suite-driven model-based fault localisation with application to pinpointing defects in student programs

Fault localisation, i.e. the identification of program locations that cause errors, takes significant effort and cost. We describe a fast model-based fault localisation algorithm that, given a test suite, uses symbolic execution methods to fully automatically identify a small subset of program locations where genuine program repairs exist. Our algorithm iterates over failing test ...