16th Conference on Solid State Analysis
) Institute of Chemical Technologies and Analytics, Division of Instrumental Analytical Chemistry, Vienna University of Technology
, Getreidemarkt 9/164-IAC,
1060 Vienna, Austria
The conference series on Solid State Analysis
(Festkrperanalytik) is devoted to the presentation of
analyticalmethodological developments and scientific-technological
problem-solving strategies within the framework of the
investigation of solids. The focus of the conference is the
exchange of information between analysts, material
scientists, solid state physicists, and technologists. The
conference takes place every two years alternately in Vienna,
Austria and Chemnitz, Germany. The 16th Conference on
Solid State Analysis, which was held at the Vienna
University of Technology, July 46, 2011, under the auspices of the
Institute of Chemical Technologies and Analytics, Vienna
University of Technology, the Institute of Chemistry and the
Institute of Physics, Chemnitz University of Technology, the
Austrian Society for Analytical Chemistry (ASAC), the
Chemikerausschuss of the Verein Deutscher
Eisenhttenleute, the Deutsche Gesellschaft fr Materialkunde, the
Fachgruppen Analytische Chemie and Festkrperchemie
und Materialforschung of the German Chemical Society
(GDCh), the Deutscher Arbeitskreis fr Angewandte
Spektroskopie, the GDMB Gesellschaft fr Bergbau,
Metallurgie, Rohstoff- und Umwelttechnik, the Deutscher
Verband fr Materialforschung und -prfung, the Deutsche
Published in the special paper collection Solid State Analysis (FKA 16)
with guest editor G. Friedbacher.
Vakuumgesellschaft e.V. (DVG), and the Fachverband
Mikrosonden of the German Physical Society, was
attended by about 200 scientists mostly from Germany
and Austria, but also including some guests from Belarus,
Czech Republic, Romania, Switzerland, and the USA
emphasizing its success as a platform bringing together
participants from academia and industry for scientific
exchange in all fields of solid state analysis.
The main topics of the conference were elemental and
compound analysis, micro- and nanoanalysis, surface and
interface analysis, trace analysis, structural analysis,
chemical reactions in solids and at solid surfaces, dynamic
behavior of solids, new instrumental developments, as well as
analytics for material development and production including
metals, semiconductors, ceramics, glass, polymers,
biomaterials, layered materials, nanostructured materials, quality
assurance, and chemometrical aspects. These topics were
covered by 9 plenary lectures and 90 contributed papers.
Plenary lectures were given by L. Eng, TU Dresden,
Germany (Multiferroics: wide-bandgap semiconductors with
challenging applications), F. Friedel, ThyssenKrupp AG,
Duisburg, Germany (Application of materials
characterization for establishing models for simulation of steels), G.
Frischat, TU Clausthal, Germany (Analytical methods for
the measurement of transport processes in glasses), I.
Gornushkin, BAM Berlin, Germany (Laser-induced
breakdown spectroscopy (LIBS) and Raman spectroscopy
for materials analysis), P. Hinterdorfer, Johannes Kepler
University, Linz, Austria (Single molecule spectroscopy
and microscopy in biology and medicine), R. Kaindl,
Joanneum Research, Weiz, Austria (Raman spectroscopy of
materialsthin layers and cordierite), A. Knop-Gericke, Fritz
Haber Institut Berlin, Germany (Investigation of solidgas
interfaces with photoelectron spectroscopy under reaction
conditions), J. Thomas, IFW Dresden, Germany (Analysis
of thin functional layers with electron diffraction), C. Vogt,
University of Hannover, Germany (Trace analysis in solids).
The scientific program was accompanied by a
commercial exhibition of analytical instruments, which gave the
opportunity to 24 companies to inform the participants
about new developments on the market. Short oral
presentations by the companies were particularly welcomed both
by the representatives and the audience.
The social program included a welcome reception on
Sunday evening and a traditional Viennese Heurigen evening in
Wien-Nussdorf at the end of the conference where the
attendees continued scientific and personal discussions in a very
charming atmosphere with Viennese wine and a typical
Viennese Heurigen buffet. Apart from this social program, the
participants had the opportunity to enjoy the lovely atmosphere
of the city of Vienna with its enormous cultural program.
Successful organization of the conference, particularly the
scientific program, was based on the activities of the members
of the scientific committee consisting of G. Friedbacher (Wien,
chair), M. Hietschold (Chemnitz, co-chair,) J. Broeckaert
(Hamburg), R. Denecke (Leipzig), H.-J. Engelmann
(Dresden), W.A. Goedel (Chemnitz), D. Gnther (Zrich), R.
Holze (Chemnitz), M. Kopnarski (Kaiserslautern), H. S.
Leipner (Halle), G. Marx (Chemnitz), J. Mayer (Aachen),
K.-H. Mller (Soest), H. Nickel (Jlich), K. Niemax
(Dortmund), H. Oechsner (Kaiserslautern), P. Portella (Berlin),
V. Thien (Mlheim), K. Wetzig (Dresden), and Ch. Ziegler
The organizers of this conference are also grateful to
the former members of the scientific committee, M.
Aeschlimann (Kaiserslautern), R. Szargan (Leipzig), and H.
Vetters (Bremen), for contributing to and developing this
conference series. The commitment of all members of the
scientific committee is an important basis for continued
success of this conference series.
Finally, the organizers would like to thank the Austrian
Ministry for Science and Research as well as all commercial
sponsors for financial support of the conference. Furthermore,
help from numerous volunteers at the Institute of Chemical
Technologies and Analytics, technical staff at the Vienna
University of Technology, and expert assistance from the staff
at Springer-Verlag are gratefully acknowledged.
The next conference on Solid State Analysis is scheduled
to take place in Chemnitz in 2013.
Gernot Friedbacher is Associate Professor of Analytical Chemistry at
the Vienna University of Technology. His research activities focus on
the investigation of surfaces and surface processes with scanning probe
microscopy and electron probe x-ray microanalysis. He has published
over 120 research articles, reviews, and book chapters, and he is editor
of the 2nd edition of Surface and Thin Film Analysis published in