Annular dark-field scanning transmission electron microscopy (ADF-STEM) tomography of polymer systemsJournal of Electron Microscopy 2010 59(S1):S39-S44; doi:10.1093/jmicro/dfq048

Journal of Electron Microscopy 59(6): 531 (2010) doi: 10.1093/jmicro/dfq077 .................................................................................................................................................................................................................................................. Corrigendum Annular dark-field scanning transmission electron microscopy (ADF-STEM) tomography of polymer systems Journal of Electron Microscopy 2010 59(S1):S39-S44; doi:10.1093/jmicro/dfq048 Kangbo Lu, Erwan Sourty and Joachim Loos Attention is drawn to an omission in the published version of this paper. Joachim Loos’s affiliations should include: 1Department of Chemical Engineering and Chemistry, Eindhoven University of Technology, PO Box 513, 5600 MB Eindhoven, The Netherlands.  (...truncated)