Momentum-resolved EELS and CL study on 1D-plasmonic crystal prepared by FIB method
Microscopy, 2024, 73(6), 473–480
DOI: https://doi.org/10.1093/jmicro/dfae022
Advance Access Publication Date: 4 May 2024
Article
Momentum-resolved EELS and CL study on 1D-plasmonic
crystal prepared by FIB method
Akira Yasuhara1,* , Masateru Shibata1 , Wakaba Yamamoto1 , Izzah Machfuudzoh2 ,
Sotatsu Yanagimoto2 and Takumi Sannomiya2,*
1
JEOL Ltd, 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan
Department of Materials Science and Engineering, School of Materials and Chemical Technology, Tokyo Institute of Technology, 4259
Nagatsuta, Midoriku, Yokohama, Tokyo 226-8503, Japan
2
To whom correspondence should be addressed. E-mail: ,
Abstract
We investigate a one-dimensional plasmonic crystal using momentum-resolved electron energy-loss spectroscopy (EELS) and cathodoluminescence (CL) techniques, which are complementary in terms of available optical information. The plasmonic crystal sample is fabricated from large
aluminum grains through the focused ion beam method. This approach allows curving nanostructures with high crystallinity, providing platforms
for detailed analysis of plasmonic nanostructures using both EELS and CL. The momentum-resolved EELS visualizes dispersion curves outside
the light cone, confirming the existence of the surface plasmon polaritons and local modes, while the momentum-resolved CL mapping analysis
identified these surface plasmon polaritons and local modes. Such synergetic approach of two electron-beam techniques offers full insights into
both radiative and non-radiative optical properties in plasmonic or photonic structures.
Key words: momentum-resolved EELS, momentum-resolved CL, surface plasmon, dispersion relation, FIB
Introduction
Electron energy-loss spectroscopy (EELS) and cathodoluminescence (CL) represent two primary electron microscopy
techniques capable of probing the optical properties of materials and devices at spatial resolutions below the diffraction
limit of light [1–3]. EELS provides insights into excitation,
while CL furnishes information about emission processes
[4,5]. Consequently, EELS and CL serve as complementary tools for investigating optical properties, each offering
access to the excitation and emission processes, respectively
[6–8]. In addition to the conventional spectral measurements, both methods support momentum-resolved measurements, enabling the analysis of the in-plane momentum of the
generated particles (e.g. photons) or quasi-particles [9–11].
This in-plane momentum analysis becomes crucial for systems with surface propagating waves, such as surface plasmon polaritons (SPPs), which find widespread applications
[12–15]. Notably, periodic structures supporting SPPs, known
as plasmonic crystals (PlCs), including metamaterials, exhibit
intriguing optical properties like cavities, waveguides and
topological features analogous to atomic crystals by introducing defects or by ‘doping’ [16–19]. When investigating PlCs
using an electron beam, the CL approach delivers high spatial
resolution for excitation with excellent momentum resolution
of emission within the light line [20]. On the other hand, EELS
allows access to the dispersion outside the light line, albeit
with a trade-off between spatial resolution and momentumresolved measurement [21]. While there have been a number
of momentum-resolved CL studies on PlCs, corresponding
EELS approaches are scarce probably due to the requirement of the electron beam transmission through the sample
material [22].
As the plasmonic materials, Al, Au, Ag and Cu nanostructures have garnered extensive attention due to their superior
optical characteristics, offering enticing applications based on
unique catalytic, electric and optical properties [15,23–25].
Despite their intrinsically high mobility of free electrons, the
optical properties of these plasmonic materials are hindered
by poor crystallinity resulting in poor propagation of SPPs
[26]. This deterioration arises from electron scattering at grain
orientation, boundaries or other atomic defects [27,28]. Additionally, challenges are also in the fabrication precision due to
variations in grain size and crystalline orientation, impacting
etching rates and mechanical stiffness. The quest for larger
crystals, preferably single crystals, is driven by the desire to
fully exploit plasmonic properties and achieve optimal structures. However, attaining such structures is nontrivial, given
that metallic nanostructures for plasmonic devices are typically produced through thin film deposition processes, which
usually produce polycrystalline films consisting of nanometer
scale grains. This constraint emphasizes the necessity to navigate the intricacies of producing larger, well-defined structures
to fully unleash the capabilities of plasmonic materials.
In this work, we utilize momentum-resolved EELS and
CL techniques to investigate one-dimensional (1D) aluminum
PlCs, allowing analyzing both inside and outside the light line.
Received 23 February 2024; Revised 16 April 2024; Editorial Decision 18 April 2024; Accepted 2 May 2024
© The Author(s) 2024. Published by Oxford University Press on behalf of The Japanese Society of Microscopy.
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A. Yasuhara et al. Momentum-resolved EELS and CL study on 1D-PlC prepared by FIB method
Through this comprehensive study of combined EELS and CL
analysis, we not only clarify the optical property of 1D PlC but
also review the advantages of both techniques. For the plasmonic material, we chose Al since it has high penetration for
the electron for EELS measurement still having moderate SPP
propagation [29]. We have achieved a high-crystallinity PlC by
employing a focused ion beam (FIB) method and fabricating
a 1D PlC structure out of bulk Al.
Experimental methods
Sample fabrication
The fabrication of 1D PlC on a free-standing Al membrane for
the transmission electron microscopy (TEM) observation was
performed by FIB (JIB-PS500i, JEOL Ltd, Japan) supporting
a drift compensation function, which enables precise processing. First, a 2-μm-thick Al block was meticulously extracted
from bulk Al. Large crystals were chosen via observation by
secondary ion microscopy in the FIB instrument. The lamella
was subsequently positioned on a Mo grid using the in situ
probe pickup method. Then, a 200-nm-thin Al lamella was
manufactured by a focused Ga-ion beam. To achieve a precisely defined 1D crystal structure with a depth of 50 nm,
fine control over the dose r (...truncated)